Accession Number : ADD004975

Title :   Elevation Sampling Terrain Probe.

Descriptive Note : Patent Application,

Corporate Author : DEPARTMENT OF THE NAVY WASHINGTON D C

Personal Author(s) : McKechnie,John C

Report Date : 24 Apr 1978

Pagination or Media Count : 23

Abstract : A surface contour sampling system is disclosed which intermittently measures the elevational irregularities in various and sundry surfaces, including those of the earth's terrain, model boards, and the like, with respect to a predetermined datum plane. A unique rotating bell crank and stepping surface sensing sampler combination permits the stepping upon and/or over large sloping or elevational changes by said surface sensing sampler, including those that are normal to the surface trend at any given location, without being stopped thereby, as it is moved forward along a predetermined path thereon by a suitable carrier vehicle. (Author)

Descriptors :   *Patent applications, *Terrain following, *Height finding, Measuring instruments, Probes, Sampling, Elevation, Surfaces

Subject Categories : Test Facilities, Equipment and Methods

Distribution Statement : APPROVED FOR PUBLIC RELEASE