Accession Number : ADD005158

Title :   Precision X-Ray Diffraction System Incorporating a Laser Aligner.

Descriptive Note : Patent,

Corporate Author : DEPARTMENT OF THE ARMY WASHINGTON D C

Personal Author(s) : Vig,John R

Report Date : 27 Dec 1977

Pagination or Media Count : 10

Abstract : This report describes an X-ray diffraction system for crystal analysis employing laser alignment to reduce errors inherent in the mechanical operation of the goniometer apparatus. (Author)

Descriptors :   *Patents, *Goniometers, Alignment, Laser beams, X ray diffraction, Calibration

Subject Categories : Test Facilities, Equipment and Methods

Distribution Statement : APPROVED FOR PUBLIC RELEASE