Accession Number : ADD006029
Title : Lattice Matching Measurement Device.
Descriptive Note : Patent Application,
Corporate Author : DEPARTMENT OF THE NAVY WASHINGTON DC
Personal Author(s) : Bottka,Nickolas
Report Date : 22 Jan 1979
Pagination or Media Count : 18
Abstract : This invention pertains to devices for measuring energy gaps of thin multilayered semiconductor devices. In particular it pertains to an apparatus and method which permit nondestructive testing of thin multilayered semiconductors to determine the lattice matching of such devices. This invention also pertains to a device which can serve as a light spectrum analyzer for photon energies corresponding to the gap energies of the multilayers. There will be a direct correlation between the light modulated signal at a given wavelength and the applied DC bias on the device.
Descriptors : *Patent applications, *Semiconductors, *Crystal lattices, *Matching, *Measuring instruments, Microprobes, Energy gaps, Layers, Nondestructive testing, Light pulses, Spectrum analyzers, Photons
Subject Categories : Test Facilities, Equipment and Methods
Solid State Physics
Distribution Statement : APPROVED FOR PUBLIC RELEASE