Accession Number : ADD006029

Title :   Lattice Matching Measurement Device.

Descriptive Note : Patent Application,

Corporate Author : DEPARTMENT OF THE NAVY WASHINGTON DC

Personal Author(s) : Bottka,Nickolas

Report Date : 22 Jan 1979

Pagination or Media Count : 18

Abstract : This invention pertains to devices for measuring energy gaps of thin multilayered semiconductor devices. In particular it pertains to an apparatus and method which permit nondestructive testing of thin multilayered semiconductors to determine the lattice matching of such devices. This invention also pertains to a device which can serve as a light spectrum analyzer for photon energies corresponding to the gap energies of the multilayers. There will be a direct correlation between the light modulated signal at a given wavelength and the applied DC bias on the device.

Descriptors :   *Patent applications, *Semiconductors, *Crystal lattices, *Matching, *Measuring instruments, Microprobes, Energy gaps, Layers, Nondestructive testing, Light pulses, Spectrum analyzers, Photons

Subject Categories : Test Facilities, Equipment and Methods
      Crystallography
      Solid State Physics

Distribution Statement : APPROVED FOR PUBLIC RELEASE