Accession Number : ADD006514

Title :   Tapered Hole Capacitive Probe.

Descriptive Note : Patent,

Corporate Author : DEPARTMENT OF THE AIR FORCE WASHINGTON DC

Personal Author(s) : Prince,Morris David

Report Date : 18 Sep 1979

Pagination or Media Count : 4

Abstract : A tapered capacitive probe embodies vertical stripes for detecting irregular flaws in metal holes. Horizontal stripes are added to the probe and connected in a one-to-one relationship with the vertical stripes to detect and measure flaws with angular uniformity. Invention allows flaws to be detected in vertical, horizontal or angular direction and discloses approximate shapes and locations. (Author)

Descriptors :   *Patents, *Holes(Openings), Defects(Materials), *Stripes, *Capacitance, Detection, Probes, Measurement, Shape, Nondestructive testing, Cracks, Metals, Fastenings, Inspection

Subject Categories : Electrical and Electronic Equipment
      Fabrication Metallurgy
      Test Facilities, Equipment and Methods

Distribution Statement : APPROVED FOR PUBLIC RELEASE