Accession Number : ADD007379

Title :   Sensitive Laser Spectroscopy Measurement System.

Descriptive Note : Patent,

Corporate Author : DEPARTMENT OF THE AIR FORCE WASHINGTON DC

Personal Author(s) : Spencer,Donald J

Report Date : 17 Jun 1980

Pagination or Media Count : 5

Abstract : A sensitive laser spectroscopy measurement system having a laser radiation source and a dual beam and detection scheme that allows for the measurement of small intensity differences between a probe beam and a reference beam resulting from the absorption, gain or scattering of the probe beam by a medium placed in its optical path. The system attains measurement sensitivity of less than 10 to the minus 4th power when the laser radiation source for the probe and reference beam is modulatable. Further included within the system is a prism placed in the optical path of the laser beam before the beam splits into the probe and reference beams and a detector for each beam. The detectors are electrically connected to a sensitivity differential amplifier and an oscilloscope for displaying the intensities of the beams. (Author)

Descriptors :   *Patents, *Spectroscopy, *Lasers, Sensitivity, High resolution, Dual mode, Radiation absorption, Synchronization(Electronics), Pulse generators

Subject Categories : Lasers and Masers
      Test Facilities, Equipment and Methods

Distribution Statement : APPROVED FOR PUBLIC RELEASE