Accession Number : ADD008065

Title :   Apparatus and Method for Integrated Circuit Test Analysis.

Descriptive Note : Patent,

Corporate Author : DEPARTMENT OF THE AIR FORCE WASHINGTON DC

Personal Author(s) : Burns,Daniel J

Report Date : 30 Dec 1980

Pagination or Media Count : 9

Abstract : An integrated circuit test analysis apparatus for visually interpreting voltage changes of active circuit components uses the electro-optic display effect of circuit electric field upon the liquid crystal layer which is applied over the circuit being tested. The normal state duty cycles in a repeating sequence of test states of the integrated circuit is modified by causing the integrated circuit to pause or maintain a particular state at one or more specific time periods for a predetermined time interval to permit the display to be recorded. (Author)

Descriptors :   *Patents, *Circuit analysis, *Liquid crystals, *Integrated circuits, Nondestructive testing, Test equipment, Electric fields, Time intervals, Voltage regulation, Electrooptics, Sequences, Clocks, Circuits, Layers, Parts

Subject Categories : Electrooptical and Optoelectronic Devices
      Test Facilities, Equipment and Methods

Distribution Statement : APPROVED FOR PUBLIC RELEASE