Accession Number : ADD008523

Title :   Dual Trace Automatic Eddy Current Detection System for Multilayer Structures.

Descriptive Note : Patent,

Corporate Author : DEPARTMENT OF THE AIR FORCE WASHINGTON DC

Personal Author(s) : Rogel,Albert P ; Scalese,Joseph J

Report Date : 19 May 1981

Pagination or Media Count : 6

Abstract : An automatic eddy current probe is revolved in a hole to be inspected, the output of the probe is divided to provide two signals to a recorder, a filtered signal will indicate the presence or absence of a flaw, a non filtered signal indicates probe position, this is particularly valuable when scanning through several structural layers. (Author)

Descriptors :   *Patents, *Probes, *Eddy currents, *Nondestructive testing, *Dual mode, Holes(Openings), Filters, Signals, Signal processing, Defects(Materials), Position(Location), Layers, Structures

Subject Categories : Test Facilities, Equipment and Methods

Distribution Statement : APPROVED FOR PUBLIC RELEASE