Accession Number : ADD008741

Title :   Apparatus and Method for Precise Determination of Crystallographic Orientation in Crystalline Substances.

Descriptive Note : Patent Application,

Corporate Author : DEPARTMENT OF THE ARMY WASHINGTON DC

Personal Author(s) : Workman,S Thomas ; Chambers,John L ; Ward,Roger W

Report Date : 03 Aug 1981

Pagination or Media Count : 9

Abstract : This document describes an apparatus and method for precisely measuring the angles of cut of single and doubly rotated cuts of quartz crystal blanks on a high volume production basis.

Descriptors :   *Patent applications, *Goniometers, *Crystal lattices, *Single crystals, Quartz resonators, Alignment, Orientation(Direction), Thermal stability, Determination, Laser beams, X ray diffraction, High rate, Precision, Quartz, Production, Crystals

Subject Categories : Test Facilities, Equipment and Methods
      Crystallography

Distribution Statement : APPROVED FOR PUBLIC RELEASE