Accession Number : ADD008914
Title : Real Time Holographic Interferometric Testing of Hybrid Microcircuits.
Descriptive Note : Patent Application,
Corporate Author : DEPARTMENT OF THE ARMY WASHINGTON DC
Personal Author(s) : Workman,Gary L ; Perry,Lawrence M
Report Date : 02 Oct 1981
Pagination or Media Count : 5
Abstract : Apparatus for non-destructive testing of hybrid microcircuits using holographic techniques. The apparatus includes a laser, a beam splitter for splitting the laser beam into two beams. The first beam is reflected through a pinhole aperture to a hologram which is positioned between the microcircuit and a detector (video camera or photomultiplier tube). The second beam is reflected through a pinhole aperture to the object (microcircuit), through a lens, and to the hologram. The circuit is energized and displacements due to thermal changes occur as firing movements in the real time interferogram. A detector monitors these changes.
Descriptors : *Patent applications, *Microelectronics, *Nondestructive testing, *Interferograms, *Laser beams, Specifications, Holography, Hybrid circuits, Beam splitting, Real time, Photomultiplier tubes, Substrates
Subject Categories : Non-radio Communications
Distribution Statement : APPROVED FOR PUBLIC RELEASE