Accession Number : ADD009533

Title :   Heterodyne Indicial Refractometer.

Descriptive Note : Patent,

Corporate Author : DEPARTMENT OF THE ARMY WASHINGTON DC

Personal Author(s) : Sattler,Joseph P ; Worchesky,Terrance L ; Ritter,Kenneth J

Report Date : 20 Apr 1982

Pagination or Media Count : 7

Abstract : A method and apparatus for simply and accurately determing the index of refraction of semiconductor materials, etalon bars and materials transparent to infrared radiation. The channel spectra of the material is obtained by passing through it a portion of radiation from a continuously tuned diode laser. Another portion of the diode laser radiation is heterodyned with radiation from a C02 laser to obtain heterodyne marker beats. The channel spectra and marker beats are displayed in conjunction whereby the frequency difference between the marker beats can be related to the number of fringes in the channel spectra between the marker beats. (Author)

Descriptors :   Patents, *Refractometers, *Refractive index, *Laser beams, *Infrared lasers, Heterodyning, Determination, Infrared radiation, Transparencies, Carbon dioxide lasers, Materials, Channels, Diodes, Tuning, Materials, Spectra, Lasers, Semiconductors, Transparence

Subject Categories : Lasers and Masers
      Optics

Distribution Statement : APPROVED FOR PUBLIC RELEASE