Accession Number : ADD011659

Title :   A nondestructive Noncontact Device to Characterize Semiconductor Material.

Descriptive Note : Patent Application,

Corporate Author : DEPARTMENT OF THE ARMY WASHINGTON DC

Personal Author(s) : Walker,C G ; Tanton,G A

Report Date : 07 Feb 1985

Pagination or Media Count : 7

Abstract : A semiconductor single crystal wafer is positioned in a magnetic field. A computer initializes the light level and the electronic gain of each detector preamp associated with a fiber optic link from the analyzer. The magnetic field direction would then be reversed by computer command. This would cause a localized change in intensity of light passing through the wafer, due to Faraday Rotation. The resulting change in detector output together with location and wavelength data could be used to compute a map of the wafer. Additional keyword: Patents. (Author)

Descriptors :   *DETECTORS, *SEMICONDUCTOR DEVICES, *PATENT APPLICATIONS, DATA LINKS, ELECTRONICS, FARADAY EFFECT, FIBER OPTICS, FREQUENCY, GAIN, INTENSITY, LIGHT, MAGNETIC FIELDS, OUTPUT, PATENTS, PREAMPLIFIERS, ROTATION, SINGLE CRYSTALS, WAFERS

Subject Categories : Test Facilities, Equipment and Methods
      Solid State Physics

Distribution Statement : APPROVED FOR PUBLIC RELEASE