Accession Number : ADD012255

Title :   Radiation Measuring System Using Transistor Flux Sensors.

Descriptive Note : Patent,

Corporate Author : DEPARTMENT OF THE AIR FORCE WASHINGTON DC

Personal Author(s) : Josephson,Vernal ; Greenberg,Edmond L

Report Date : 25 Feb 1986

Pagination or Media Count : 11

Abstract : An ionizing radiation intensity dosimeter apparatus and method based on carrier recombination saturation times for irradiated PN junction semiconductor devices following termination of a radiation pulse. Normally-on quiescent condition, moderate radiation doses at relatively high dose rates, and a read-out arrangement employing gated burst counting are included. (Author)

Descriptors :   *PATENTS, *COUNTING METHODS, *DETECTORS, MEASUREMENT, DOSE RATE, FLUX(RATE), RADIATION DOSAGE, HIGH RATE, GATES(CIRCUITS), RADIATION, PULSES, RUPTURE

Subject Categories : Test Facilities, Equipment and Methods

Distribution Statement : APPROVED FOR PUBLIC RELEASE