Accession Number : ADD012456

Title :   Radiative Opacity and Emissivity Measuring Device.

Descriptive Note : Patent,

Corporate Author : DEPARTMENT OF THE NAVY WASHINGTON DC

Personal Author(s) : Ripin,Barrett H ; Whitlock,Robert R

Report Date : 01 Jul 1986

Pagination or Media Count : 10

Abstract : This patent discloses an apparatus for measuring the emissivity and opacity coefficients of a test plasma. The apparatus includes a target comprising a support structure of a carrier material with an asymmetrical sample of a test material disposed thereon, a drive for ionizing the test material into a test plasma and the carrier material into a carrier plasma, and spectrographs for measuring the intensity of photons traversing said test plasma. Embodiments including a separate photon source are also disclosed.

Descriptors :   *PATENTS, *DIAGNOSTIC EQUIPMENT, *PLASMA DIAGNOSTICS, PLASMAS(PHYSICS), PHOTONS, EMISSION SPECTRA, RADIATION ABSORPTION, ABSORPTION SPECTRA, OPACITY, COEFFICIENTS, RADIANT INTENSITY, SPECTROGRAPHS, X RAY SPECTROSCOPY, ULTRAVIOLET SPECTROSCOPY

Subject Categories : Test Facilities, Equipment and Methods
      Optics
      Plasma Physics and Magnetohydrodynamics

Distribution Statement : APPROVED FOR PUBLIC RELEASE