Accession Number : ADD012872
Title : Time Resolved Extended X-Ray Absorption Fine Structure Spectrometer.
Descriptive Note : Patent,
Corporate Author : DEPARTMENT OF THE NAVY WASHINGTON DC
Personal Author(s) : Huang,Huey W
Report Date : 16 Sep 1986
Pagination or Media Count : 7
Abstract : The present invention relates to an X-ray spectrometer for obtaining EXAFS data from a target material. The target material is exposed to incident pulsed synchrotron/X-ray radiation having a selected range of continuous spectrum and intensity suitable for obtaining EXAFS data from the material. The transmitted or fluorescence X-rays is detected and integrated over a period of time. The integrator is controlled by a gate synchronous with the pulsed radiation. The integration time of the integrator can be varied. A xenon flash is provided for exciting appropriate materials and is controlled by a gating device which is also synchronized with the radiation pulses.
Descriptors : *PATENTS, *X RAYS, *SPECTROMETERS, TIME, PULSES, RADIATION, SYNCHROTRONS, CONTINUOUS SPECTRA, XENON LAMPS, INTEGRATION, MATERIALS, TARGETS
Subject Categories : Physical Chemistry
Distribution Statement : APPROVED FOR PUBLIC RELEASE