Accession Number : ADD013003
Title : Contactless Hall Coefficient Measurement and Method.
Descriptive Note : Patent Application,
Corporate Author : DEPARTMENT OF THE ARMY WASHINGTON DC
Personal Author(s) : Ballato,Arthur ; Leupold,Herbert A
Report Date : 14 Jul 1987
Pagination or Media Count : 27
Abstract : A method and apparatus for the contactless, nondestructive measurement of Hall coefficient and resistivity of a piezoelectric semiconductor sample. The material to be tested is formed in a disk which is supported at its edge by a holder. The disc is free to vibrate. Two pairs of electrodes, placed above and below the sample, excite the sample into and beyond piezoelectric resonance. Then a magnetic field is applied to the sample and the sample again driven into and beyond resonance. Comparison between the performance of the disk before and after application of the magnetic field yields data from which Hall coefficient can be determined.
Descriptors : *PATENT APPLICATIONS, *HALL EFFECT, *SEMICONDUCTORS, *PIEZOELECTRIC MATERIALS, COEFFICIENTS, DISKS, ELECTRODES, MAGNETIC FIELDS, MEASUREMENT, NONDESTRUCTIVE TESTING, RESISTANCE, RESONANCE, YIELD
Subject Categories : Electrical and Electronic Equipment
Distribution Statement : APPROVED FOR PUBLIC RELEASE