Accession Number : ADD013019

Title :   High-Sensitivity Infrared Polarimeter.

Descriptive Note : Patent Application,

Corporate Author : DEPARTMENT OF THE ARMY WASHINGTON DC

Personal Author(s) : Tanton,George A ; Grisham,John A

Report Date : 04 May 1987

Pagination or Media Count : 7

Abstract : This paper discusses an infrared polarimeter that measures the amount or degree of the rotation of the plane of polarization of plane polarized radiation after the radiation has passed through a cadium sulfide (Cds) wafer. Relatively small magnetic fields are used and increased sensitivity is realized by using a chopping wheel to chop the laser beam, providing a reference frequency, and by using a synchronous detector to obtain high signal to noise ratios of the detected signal. As a result of greater sensitivity of the high-sensitivity infrared polarimeter, electronic carrier concentrations as low as 10 to the 15th power /cm 3 can be measured in cadmium sulfide with magnetic fields as low as 0.1 Tesla.

Descriptors :   *PATENT APPLICATIONS, *INFRARED RADIATION, *POLARIMETERS, CADMIUM SULFIDES, SIGNALS, MAGNETIC FIELDS, POLARIZATION, RADIATION, FREQUENCY, DETECTORS, SYNCHRONISM, CHARGE CARRIERS, ELECTRONICS, HIGH SENSITIVITY, LASER BEAMS, SIGNAL TO NOISE RATIO, MAGNETIC FIELDS, WHEELS

Subject Categories : Test Facilities, Equipment and Methods

Distribution Statement : APPROVED FOR PUBLIC RELEASE