Accession Number : ADD013130

Title :   Piezoelectric Material Testing Method and Apparatus.

Descriptive Note : Patent, Filed 4 May 84, patented 26 May 87,

Corporate Author : DEPARTMENT OF THE AIR FORCE WASHINGTON DC

Personal Author(s) : Hickernell,Frederick S ; Adamo,Michael D ; Cho,Frederick Y

Report Date : 26 May 1987

Pagination or Media Count : 8

Abstract : An arrangement for testing substrate material intended for use in surface acoustic wave devices such as delay lines; the arrangement includes a plurality of electrical and physical evaluations of the material in quantities suitable for a manufacturing environment. In one evaluation acoustic wave energy developed in a tooling jig mounted transducer is mechanically coupled to successive material samples and the resulting output waveforms compared to expected results while in other evaluations the polarized light indicia and chemical reagent determined properties of the material samples are considered.

Descriptors :   *PATENTS, *SURFACE ACOUSTIC WAVE DEVICES, *PIEZOELECTRIC CRYSTALS, *DELAY LINES, *LITHIUM NIOBATES, *TEST EQUIPMENT, ELECTRICAL PROPERTIES, PHYSICAL PROPERTIES, SUBSTRATES, TEST METHODS, PULSE GENERATORS, WAFERS, NONDESTRUCTIVE TESTING

Subject Categories : Line, Surface and Bulk Acoustic Wave Devices
      Test Facilities, Equipment and Methods

Distribution Statement : APPROVED FOR PUBLIC RELEASE