Accession Number : ADD013637

Title :   Anisotropic Magnetoresistance Measurement Apparatus and Method Thereof.

Descriptive Note : Patent Application, Filed 20 Jan 88,

Corporate Author : DEPARTMENT OF THE NAVY WASHINGTON DC

Personal Author(s) : Cavallo, John M

Report Date : 20 Jan 1988

Pagination or Media Count : 17

Abstract : The present invention is an apparatus and method for the nondestructive testing of the anisotropic magnetoresistance parameters of a film. A plurality of contacts points are securely disposed in a generally planar support means and engagable with a surface of the film for measuring the anisotropic magnetoresistance parameters of the film in accord with a predetermined equation. (Patent Applications)

Descriptors :   *MAGNETORESISTANCE, *MEASURING INSTRUMENTS, *NONDESTRUCTIVE TESTING, ANISOTROPY, EQUATIONS, FILMS, PARAMETERS, PLANAR STRUCTURES, SURFACES, PATENT APPLICATIONS

Subject Categories : Test Facilities, Equipment and Methods
      Electricity and Magnetism

Distribution Statement : APPROVED FOR PUBLIC RELEASE