Accession Number : ADD013895

Title :   Method for Analyzing Materials Using X-Ray Fluorescence.

Descriptive Note : Patent Application, Filed 1 Aug 88,

Corporate Author : DEPARTMENT OF THE NAVY WASHINGTON DC

Personal Author(s) : Kirkland, Johnny P ; Elam, Timothy ; Filfrich, John V

Report Date : 01 Aug 1988

Pagination or Media Count : 12

Abstract : The invention pertains broadly to x-ray techniques used to analyze materials, and in particular techniques based on x-ray fluorescence. Accordingly, and object of the invention is to enable one to do quantitative elemental analysis using x-ray fluorescence, as well fine structure analysis. Another object of the invention is to enable one to do the foregoing simply, and with one apparatus, and with increased sensitivity, and with less complicated and expensive detectors. Keywords: Patent application; X-ray absorption analysis. (KT)

Descriptors :   *FLUORESCENCE, *PATENT APPLICATIONS, *X RAY ABSORPTION ANALYSIS, *X RAY LUMINESCENCE, ABSORPTION SPECTRA, DETECTORS, INVENTIONS, QUANTITATIVE ANALYSIS, SPECTRUM ANALYSIS, STRUCTURAL ANALYSIS, X RAYS

Subject Categories : Test Facilities, Equipment and Methods
      Physical Chemistry
      Nuclear Physics & Elementary Particle Physics

Distribution Statement : APPROVED FOR PUBLIC RELEASE