Accession Number : ADD013924

Title :   Thermal Test Chamber Device.

Descriptive Note : Patent Application, Filed 27 Oct 88,

Corporate Author : DEPARTMENT OF THE ARMY WASHINGTON DC

Personal Author(s) : Holderfield, Daron C ; Martin, Bernard E ; Russell, Samuel S

Report Date : 27 Oct 1988

Pagination or Media Count : 11

Abstract : A thermal test chamber device is provided that includes two half housing sections that are secured together to define a chamber there between with a window for viewing inside the chamber and with inlet and outlet means for supplying and exhausting a medium to and from the chamber. The lower half housing section has electrical circuit means mounted relative thereto for testing a semiconductor chip specimen when presented relative thereto. Keywords: Patent applications, Thermal cycling. (aw)

Descriptors :   *CHAMBERS, *PATENT APPLICATIONS, *CHIPS(ELECTRONICS), *CIRCUIT TESTERS, CIRCUITS, CYCLES, HEATING, HOUSINGS, TEST EQUIPMENT, TEST FACILITIES, THERMAL PROPERTIES, SEMICONDUCTORS

Subject Categories : Electrical and Electronic Equipment
      Test Facilities, Equipment and Methods

Distribution Statement : APPROVED FOR PUBLIC RELEASE