Accession Number : ADD013930

Title :   Manual Microcircuit Die Test System.

Descriptive Note : Patent Application, Filed 27 Oct 88,

Corporate Author : DEPARTMENT OF THE ARMY WASHINGTON DC

Personal Author(s) : Holderfield, Daron C ; Martin, Bernard E ; Russell, Samuel S

Report Date : 27 Oct 1988

Pagination or Media Count : 13

Abstract : A system for testing semiconductor microchips is provided in which individual microchips can be tested electrically and under specific thermal conditions simultaneously to determine the reliability of the microchip under operating conditions. This system is unique and economically operable so as to enable all individual chips to be tested prior to mounting in larger assemblies. Patent applications. (RH)

Descriptors :   *CHIPS(ELECTRONICS), *MICROELECTRONICS, *PATENT APPLICATIONS, *SEMICONDUCTORS, THERMAL PROPERTIES

Subject Categories : Test Facilities, Equipment and Methods
      Electrical and Electronic Equipment
      Solid State Physics

Distribution Statement : APPROVED FOR PUBLIC RELEASE