Accession Number : ADD014249

Title :   Reflectometers.

Descriptive Note : Patent, Filed 9 Oct 87, patented 28 Mar 89,

Corporate Author : DEPARTMENT OF THE NAVY WASHINGTON DC

Personal Author(s) : Snail, Keith A

Report Date : 28 Mar 1989

Pagination or Media Count : 12

Abstract : Systems for measuring the diffuse reflectances of various samples are constructed to include a primary mirror (e.g., an ellipsoidal mirror) and a secondary mirror (e.g., a compound parabolic concentrator) cooperating with a radiation source, and a radiation detector. Keywords: Patents; Mirrors; Reflectometers; Optical detectors; Diffusion; Ellipsoids; Parabolas. (SDW)

Descriptors :   *PATENTS, *REFLECTOMETERS, CONCENTRATION(COMPOSITION), DETECTORS, DIFFUSION, ELLIPSOIDS, MIRRORS, OPTICAL DETECTORS, PARABOLAS, RADIATION, REFLECTANCE, SECONDARY, SOURCES

Subject Categories : Optics
      Test Facilities, Equipment and Methods

Distribution Statement : APPROVED FOR PUBLIC RELEASE