Accession Number : ADD014687

Title :   Emittance Measuring Device for Charged Particle Beams.

Descriptive Note : Patent Application, Filed 5 Jul 90,

Corporate Author : DEPARTMENT OF THE NAVY WASHINGTON DC

Personal Author(s) : Fiorito, Ralph B ; Rule, Donald W

Report Date : 05 Jul 1990

Pagination or Media Count : 9

Abstract : The invention is a device to measure the emittance of a charged particle beam. The device is capable of providing precise time resolution limited only by the chosen detector. The device allows a complete emittance determination as a function of time. The preferred embodiment of the invention comprises a plurality of thin foils 11 which generate an optical transition radiation (OTR) pattern 13; a lens system 14 to collect the OTR pattern 13 from the said foils 11; an optical mask 16 to allow passage of the OTR pattern 13: and a detector array 17 or similar device placed behind the mask 16 which intercepts, senses and measures the point source OTR pattern 13 for each perforation in the mask. Keywords: Patent applications. (jhd)

Descriptors :   *CHARGED PARTICLES, *EMITTANCE, *PARTICLE BEAMS, *PATENT APPLICATIONS, DETERMINATION, ELECTROMAGNETIC RADIATION, MEASURING INSTRUMENTS, OPTICAL PROPERTIES, PRECISION, RESOLUTION, SOURCES, TIME, TRANSITIONS

Subject Categories : Particle Accelerators

Distribution Statement : APPROVED FOR PUBLIC RELEASE