Accession Number : ADD014790
Title : Assembly for Detecting and Recording Surface Contour Data.
Descriptive Note : Patent, Filed 31 Oct 89, patented 11 Dec 90,
Corporate Author : DEPARTMENT OF THE NAVY WASHINGTON DC
Personal Author(s) : Yamanounchi, Glenn T ; Orillo, Stephen, Jr
Report Date : 11 Dec 1990
Pagination or Media Count : 6
Abstract : A surface examination assembly for examining surface contours by detecting and recording surface contour data including profile data to determine the existence of variations of the surface from design specifications, and to determine the existence of structural degradation as indicated by surface contour changes includes a mounting frame for holding the assembly elements and for mounting the assembly on or near the surface to be examined, a probe arm adjustable mounted on the frame by means of a slide block, the slide block permitting movement of the probe arm in both a vertical and a horizontal position relative to the frame, a recording device for use with a recording medium mounted on the frame, the recording device being operatively engaged with the probe arm and moveable in response thereto to permit contour and profile data detected by the probe arm to be transmitted through the recording device to the recording medium. The assembly set includes alternate probe arms of differing shapes and sizes for use with different surface locations and contours and also includes alternative slide block extensions to permit adjustment of the assembly.
Descriptors : CONTOURS, RECORDING SYSTEMS, SURFACES, ADAPTERS, ASSEMBLY, CONTOURS, DEGRADATION, FRAMES, HORIZONTAL ORIENTATION, MOUNTS, POSITION(LOCATION), PROBES, PROFILES, RECORDING SYSTEMS, STRUCTURAL PROPERTIES, SURFACES
Subject Categories : Test Facilities, Equipment and Methods
Distribution Statement : APPROVED FOR PUBLIC RELEASE