Accession Number : ADD015371

Title :   Emittance Measuring Device for Charged Particle Beams.

Descriptive Note : Patent, Filed 5 Jul 90, Patented 9 Jun 92,

Corporate Author : DEPARTMENT OF THE NAVY WASHINGTON DC

Personal Author(s) : Fiorito, Ralph B ; Rule, Donald W

Report Date : 09 Jun 1992

Pagination or Media Count : 5

Abstract : The invention is a device to measure the emittance of a charged particle beam. The device is capable of providing precise time resolution limited only, by the chosen detector. The device allows a complete emittance determination as a function of time. The preferred embodiment of the invention comprises a plurality of thin foils which generate an optical transition radiation (OTR) pattern: a lens system to collect the OTR pattern from the said foils: an optical mask to allow passage of the OTR pattern: and a detector array or similar device placed behind the mask which intercepts, senses and measures the point source OTR pattern for each perforation in the mask.

Descriptors :   *CHARGED PARTICLES, *PARTICLE BEAMS, *OPTICAL DETECTORS, *PATENTS, ARRAYS, DETECTORS, DETERMINATION, EMITTANCE, FUNCTIONS, MASKS, PARTICLES, PATTERNS, PERFORATION, RADIATION, RESOLUTION, TIME, OPTICAL LENSES

Subject Categories : Particle Accelerators
      Optical Detection and Detectors

Distribution Statement : APPROVED FOR PUBLIC RELEASE