Accession Number : ADD017387

Title :   In Situ Dynamic Material Property Measurement System.

Descriptive Note : Patent, Filed 19 Oct 92, patented 15 Nov 94,

Corporate Author : DEPARTMENT OF THE NAVY WASHINGTON DC

Personal Author(s) : Madigosky, Walter

Report Date : 15 Nov 1994

Pagination or Media Count : 6

Abstract : Material is periodically indented by a probe driven at an oscillation frequency by a shaker regulated by an analyzer to which input measurement data is fed from a sensing head connecting the shaker to the probe for in Situ measurement of material resistance to indentation to which such input data relates. A computer connected to the analyzer is programmed to calculate steady-state data on dynamic material properties as a time dependent function, from outputs of the analyzer restricted to limits determined from the input measurement data. (MM)

Descriptors :   *VIBRATION, *PHYSICAL PROPERTIES, *MATERIALS, *PATENTS, MEASUREMENT, VISCOELASTICITY, MODULUS OF ELASTICITY, FAST FOURIER TRANSFORMS, HARDNESS, SPECTRUM ANALYZERS, SHAKING

Subject Categories : Mechanics

Distribution Statement : APPROVED FOR PUBLIC RELEASE