Accession Number : ADD017438

Title :   Ultrasonic Two Probe System for Locating and Sizing.

Descriptive Note : Patent, filed 26 Oct 92, patented 24 Jan 95,

Corporate Author : DEPARTMENT OF THE NAVY WASHINGTON DC

Personal Author(s) : Wallingford, Errol E ; DeNale, Robert

Report Date : 24 Jan 1995

Pagination or Media Count : 21

Abstract : A two probe time-of-flight system has a transmit probe emitting a diverging beam into a test material at a certain beam-center angle, and a receive probe with its main beam extending into the test material at that same angle. with the two probes being arranged symmetrical about a centerline normal to the test face. The transmit probe generates a pulse wherein a portion of the pulse reflects at the incident angle back to the receive probe, which detects the reflections and marks the reception time as a reference. A sampling unit captures subsequent echo energy returning from a region within the test material. The sampled energy above a given threshold is processed to identify the sample times relative to the marked reference time. The identified sample times are used to determine the depth that the echo energy originated from. Consecutive identified samples in the depth direction are used to detect the height of a flaw within the test material. By scanning the probes in an x-y pattern. the planar dimensions of the flaw are determined.

Descriptors :   *ULTRASONICS, *RADIOGRAPHY, *PATENTS, ANGLES, EMISSION, PROBES, ENERGY, X RAYS, DEPTH, TIME, GRIDS(COORDINATES), ECHOES, FLIGHT, PLANAR STRUCTURES, SAMPLING, PATTERNS, RECEPTION

Subject Categories : Acoustics
      Test Facilities, Equipment and Methods

Distribution Statement : APPROVED FOR PUBLIC RELEASE