Accession Number : ADD017629
Title : Multiple, Parallel, Spatial Phase Measurement.
Descriptive Note : Patent Application, Filed 12 Jun 95,
Corporate Author : DEPARTMENT OF THE NAVY WASHINGTON DC
Personal Author(s) : Levitt, Hal L ; Tsee, Anthony Y
PDF Url : ADD017629
Report Date : 12 Jun 1995
Pagination or Media Count : 30
Abstract : A signal processing apparatus for providing accurate electrical phase difference measurement of multiple concurrent signal inputs is disclosed. Phase measurement of an individual signal input is accompished utilizing an efficient spatial sampling scheme. In operation, measurement and reference wideband RF inputs, differing primarily in phase over frequency, are respectively applied to two RF Channelizer components. Each Channelizer separates the composite input bandwidth into multiple time coincident frequency output channels. Corresponding pairs of output channels then phase modulate a common independent carrier which propagates to the detection plane of a photodetector array forming a spatial interference pattern along one axis for each frequency channel number. A preferred detector element scaling relative to the interference pattern affords efficient phase difference measurement incorporating three detector elements at each frequency channel. Conversion of the preferred three detector element intensity values to relative signal phase is accomplished with an algorithm.
Descriptors : *SIGNAL PROCESSING, *PATENT APPLICATIONS, *PHASE MEASUREMENT, ALGORITHMS, INPUT, OUTPUT, SPATIAL DISTRIBUTION, ARRAYS, EFFICIENCY, SCALING FACTOR, SAMPLING, INTERFERENCE, PATTERNS, BANDWIDTH, PHOTODETECTORS, CHANNELS, PHASE MODULATION
Subject Categories : Electrooptical and Optoelectronic Devices
Distribution Statement : APPROVED FOR PUBLIC RELEASE