Accession Number : ADD017698

Title :   Non-Contacting Capacitance Probe for Dielectric Cure Monitoring.

Descriptive Note : Patent, Filed 14 Sep 92, patented 25 Jul 95,

Corporate Author : DEPARTMENT OF THE NAVY WASHINGTON DC

Personal Author(s) : Gammell, Paul M

Report Date : 25 Jul 1995

Pagination or Media Count : 8

Abstract : Conductive measuring electrodes, of a capacitive probe having a grounded guard electrode positioned there between shield a probe circuit, provides mutual capacitance measurements which way as a function of changes in impedance of dielectric material being monitored as it undergoes a curing process. The probe is positioned in nonembedded relation to the dielectric material to form a sensitivity region therein through which an electric field extends between the conductive measuring electrodes of the probe to establish said variable mutual capacitance measurements without extraneous influences.

Descriptors :   *DIELECTRIC PROPERTIES, *MONITORS, *ELECTRICAL MEASUREMENT, *PATENTS, PROBES, MONITORING, CONDUCTIVITY, ELECTRIC FIELDS, SENSITIVITY, ELECTRODES, CIRCUITS, CURING, ELECTRICAL IMPEDANCE, CAPACITANCE

Subject Categories : Electricity and Magnetism

Distribution Statement : APPROVED FOR PUBLIC RELEASE