Accession Number : ADD017698
Title : Non-Contacting Capacitance Probe for Dielectric Cure Monitoring.
Descriptive Note : Patent, Filed 14 Sep 92, patented 25 Jul 95,
Corporate Author : DEPARTMENT OF THE NAVY WASHINGTON DC
Personal Author(s) : Gammell, Paul M
Report Date : 25 Jul 1995
Pagination or Media Count : 8
Abstract : Conductive measuring electrodes, of a capacitive probe having a grounded guard electrode positioned there between shield a probe circuit, provides mutual capacitance measurements which way as a function of changes in impedance of dielectric material being monitored as it undergoes a curing process. The probe is positioned in nonembedded relation to the dielectric material to form a sensitivity region therein through which an electric field extends between the conductive measuring electrodes of the probe to establish said variable mutual capacitance measurements without extraneous influences.
Descriptors : *DIELECTRIC PROPERTIES, *MONITORS, *ELECTRICAL MEASUREMENT, *PATENTS, PROBES, MONITORING, CONDUCTIVITY, ELECTRIC FIELDS, SENSITIVITY, ELECTRODES, CIRCUITS, CURING, ELECTRICAL IMPEDANCE, CAPACITANCE
Subject Categories : Electricity and Magnetism
Distribution Statement : APPROVED FOR PUBLIC RELEASE