Accession Number : ADD017832

Title :   Method For Determining the Effects of Stress.

Descriptive Note : Patent, Filed 29 May 91, patented 1 Aug 95,

Corporate Author : DEPARTMENT OF THE NAVY WASHINGTON DC

Personal Author(s) : Ehrenpreis, David B ; Haisler, Walter E

Report Date : 01 Aug 1995

Pagination or Media Count : 9

Abstract : A method of determining the effects of stress on a non- linear orthotropic missile structure. Measurements of non-linear orthotropic strain, due to step-wise increasing stress in one of three orthogonal directions, are made. Nonlinear orthotropic strain terms of the missile structure, in each of three orthogonal directions, are determined from the measurements. A compliance matrix is formed by using the determined strain terms. This compliance matrix is used in an iterative fashion of step-wise increasing stress, to determine three dimen- sional strain of the missile structure. (AN)

Descriptors :   *STRESS ANALYSIS, *PATENTS, STRESS STRAIN RELATIONS, COMPUTER PROGRAMS, MATHEMATICAL MODELS, GUIDED MISSILES, LOAD DISTRIBUTION, STRUCTURAL PROPERTIES, MATRICES(MATHEMATICS), STRUCTURAL ANALYSIS, DEFORMATION, STIFFNESS, DISPLACEMENT, MODULUS OF ELASTICITY, THREE DIMENSIONAL, NONLINEAR SYSTEMS, SHEAR STRESSES, TENSION, BUCKLING, NONLINEAR ANALYSIS, COMPRESSIVE STRENGTH, ORTHOGONALITY, BENDING MOMENTS, INTERNAL PRESSURE

Subject Categories : Mechanics

Distribution Statement : APPROVED FOR PUBLIC RELEASE