Accession Number : ADD018216

Title :   Method and Apparatus for Determining Both Density and Atomic Number of a Material Composition Using Compton Scattering.

Descriptive Note : Patent Application, Filed 31 May 96,

Corporate Author : DEPARTMENT OF THE NAVY WASHINGTON DC

Personal Author(s) : Ham, Young S ; Poranski, Chester F

PDF Url : ADD018216

Report Date : 31 May 1996

Pagination or Media Count : 20

Abstract : An x-ray backscatter tomography system includes a collimated x-ray source for directing a collimated beam towards a target at a select position and orientation, a first detector array for measuring photons scattered at a selected first angle, and a second detector array for measuring photons scattered at a selected second angle different from the first angle. The system also includes means responsive to the first and second detectors for calculating the density and atomic number of the target.

Descriptors :   *PATENT APPLICATIONS, *TOMOGRAPHY, *COMPTON SCATTERING, *APPARENT DENSITY, ELECTRON DENSITY, BACKSCATTERING, FREE ELECTRONS, PHOTONS, ATOMIC PROPERTIES, MOMENTUM TRANSFER, COLLIMATORS

Subject Categories : Atomic and Molecular Physics and Spectroscopy
      Nuclear Physics & Elementary Particle Physics

Distribution Statement : APPROVED FOR PUBLIC RELEASE