Accession Number : ADM000524
Title : HTMIAC/CINDAS Silicon Properties Database (Interim) (Computer Diskette).
Corporate Author : HIGH TEMPERATURE MATERIALS INFORMATION ANALYSIS CENTER WEST LAFAYETTE IN
Report Date : MAR 1995
Pagination or Media Count : 1
Abstract : File characteristics: Database (5 files); Binary character set. Physical description: 1 computer diskette; 3 1/2 in.; high density; 1.4MB. System requirements: PC compatible; DOS; Dbase. The Silicon Properties Database presents numerical data and technical information on the properties of pure and doped silicon. Materials comprise a variety of doped silicon materials, having both n-type and p-type conduction, as well as intrinsic silicon. Property coverage includes optical (absorption) coefficient, refractive index, and band gap), thermoradiative (normal spectral reflectance, angular spectral reflectance, normal spectral emittance, and normal spectral transmittance), electrical (electrical conductivity and dielectric constant), thermophysical (thermal conductivity, specific heat, thermal expansion, and lattice parameters), damage threshold (rain erosion and laser irradiation), and mechanical (eleastic constants, stress-strain, yield strength under tensile, compressive, and shear loading, flexural strength, fracture toughness, and hardness).
Descriptors : *MAGNETIC DISKS, *DATA BASES, *USER MANUALS, *SILICON, CHEMICAL PROPERTIES, HIGH TEMPERATURE, TECHNICAL INFORMATION CENTERS, MATERIALS, UNIVERSITIES, RESEARCH MANAGEMENT, MECHANICAL PROPERTIES, PHYSICAL PROPERTIES.
Subject Categories : Recording and Playback Devices
Distribution Statement : APPROVED FOR PUBLIC RELEASE