Accession Number : ADP002232

Title :   Digital System Upset--The Effects of Simulated Lightning-Induced Transients on a General Purpose Microprocessor,

Corporate Author : NATIONAL AERONAUTICS AND SPACE ADMINISTRATION HAMPTON VA LANGLEY RESEARCH CENTER

Personal Author(s) : Belcastro,C. M.

Report Date : 1983

Pagination or Media Count : 12

Abstract : Flight-critical computer-based control systems designed for advanced aircraft must exhibit ultrareliable performance in lightning-charged environments. Digital system upset can occur as a result of lightning-induced electrical transients, and a methodology has been developed to test specific digital systems for upset susceptibility. Initial upset data indicates that there are several distinct upset modes and that the occurrence of upset is related to the relative synchronization of the transient input with the processing state of the digital system. A large upset test data base will aid in the formulation and verification of analytical upset reliability modeling techniques which are being developed. (Author)

Descriptors :   *Digital computers, Avionics, Aircraft equipment, Lightning, Transients, Electric current, Failure(Electronics), Vulnerability, Test methods, Symposia

Distribution Statement : APPROVED FOR PUBLIC RELEASE