Accession Number : ADP002328
Title : A Structured Design of Multiple-Valued LSI/VLSI with Built-In Testing Capability.
Corporate Author : OKLAHOMA UNIV NORMAN SCHOOL OF ELECTRICAL ENGINEERING AND COMPUTER SCIENCE
Personal Author(s) : Lee,S. C. ; Santrakul,K.
Report Date : MAY 1983
Pagination or Media Count : 8
Abstract : In this paper a structured design of subsystems of an MV LSI/VLSI chip with built-in testing capability is presented. This structured design which uses multiplexers and DFF's is obtained through the use of a tree-structured ASM chart. Since these circuits are highly structured and the procedure for obtaining the circuit values of the design from the ASM chart is rather straightforward and systematic, this design process may be adapted for automation. (Author)
Descriptors : *Logic circuits, *Test methods, *Symposia, Multiplexing, Self contained, Multiple operation, Circuits, Value
Distribution Statement : APPROVED FOR PUBLIC RELEASE