Accession Number : ADP002346

Title :   Tolerance Analysis and Related Measurements on MVL-CCD's (Multiple-Valued Logic-Charge-Coupled Devices),

Corporate Author : TECHNISCHE HOGESCHOOL TWENTE ENSCHEDE (NETHERLANDS) DEPT OF ELECTRICAL ENGINEERING

Personal Author(s) : Kerhoff,H. G. ; Groot,J. de ; Brombacher,A. C.

Report Date : MAY 1983

Pagination or Media Count : 10

Abstract : Prior to designing an MVL system on a single silicon chip, it is necessary to perform a feasibility study on the marginal reliability aspects of the system to be implemented. In this paper, the expected tolerances in basic CCD gate configurations are investigated by a statistical approach to the problem for which the Monte Carlo analysis method has been chosen. The expected tolerances were compared with actual data obtained from measurements. As any MVL function can be synthesized by means of these configurations, the tolerance behaviour of a function can be investigated by a general applicable analysis method based on the Monte Carlo tolerance analysis approach. The predecessor circuit was used to illustrate the procedure followed. (Author)

Descriptors :   *Charge coupled devices, *Logic circuits, *Gates(Circuits), *Chips(Electronics), *Silicon, *Symposia, Monte Carlo method, Statistical processes, Tolerance, Input output devices, Reliability, Configurations, Netherlands

Distribution Statement : APPROVED FOR PUBLIC RELEASE