Accession Number : ADP002461

Title :   Non Destructive Observation of Random Electrical Twinning in Cultured Quartz,

Corporate Author : CENTRE NATIONAL DE LA RECHERCHE SCIENTIFIQUE BESANCON (FRANCE)

Personal Author(s) : Merigoux,H. ; Darces,J. F. ; Zecchini,P. ; Lamboley,J.

Report Date : 1983

Pagination or Media Count : 5

Abstract : It is well known that in a cultured quartz bar we can observe, around the seed, several growth zones which are indicated by Z, +X, -X... These zones have been described either by X-ray topography or by gamma-ray irradiation. By infrared spectroscopy we find that we can distinguish between these zones. Since their infrared spectra are different according to the trapped impurities it is easy to identify each growth zone from its spectrum. Sometimes, among our irradiated blanks, we note that we can see, inside the normally -X zone, the +X zone's characteristic blackening. The IR spectra confirm the irregular presence of the two zones. Taking into account the crystal symmetry we can explain these observations. There is a new supplementary two fold axis. This axis commands the electrical twinning. According to the IEEE convention this kind of twinning only changes the resonator's theta and phi angle sign.

Descriptors :   *Quartz resonators, *Twinning(Crystallography), *Nondestructive testing, Crystal structure, Irradiation, Infrared spectroscopy, X ray diffraction

Distribution Statement : APPROVED FOR PUBLIC RELEASE