Accession Number : ADP002600

Title :   Microstructure-Property Relations in Sputtered Films,

Corporate Author : PENNSYLVANIA STATE UNIV UNIVERSITY PARK MATERIALS RESEARCH LAB

Personal Author(s) : Messier,R.

Report Date : 1982

Pagination or Media Count : 19

Abstract : The mechanical and chemical properties of thin films depend at least in part on their microstructure. A structure zone model common to all vapor deposition methods has been developed to classify the various physical microstructures found.

Descriptors :   *Coatings, *Carbon, *Symposia, *Optical coatings, *Thin films, Microstructure, Chemical properties, Mechanical properties, Mathematical models

Distribution Statement : APPROVED FOR PUBLIC RELEASE