Accession Number : ADP003514
Title : A Dual-Ported, Dual-Polarized Spherical Near-Field Probe,
Corporate Author : SCIENTIFIC-ATLANTA INC GA
Personal Author(s) : Jones,J. R. ; Hardin,D. P.
Report Date : MAR 1984
Pagination or Media Count : 15
Abstract : The spherical near-field measurement technique is a convenient and economical method for testing antennas. It is particularly useful for electrically small antennas at low frequencies. It requires much less real estate than conventional far-field ranges and yields more accurate results in a more controlled and secure environment. The spherical near-field measurement technique can be used to test antennas too large in physical size for the compact range technique and, unlike other near-field measurement techniques, it permits the use of standard spherical coordinate positioners. The most serious disadvantage of spherical near-field testing is the time required to perform a test.
Descriptors : *Detectors, *Near field, *Antenna radiation patterns, *Directional antennas, Low frequencies, Compacting, Electrical properties, Measurement, Methodology, Polarization, Digital computers, Antennas
Distribution Statement : APPROVED FOR PUBLIC RELEASE