Accession Number : ADP005421

Title :   Evaluation of Localized Inhomogeneities in the Reflectivity of Planar Absorber Panels,

Corporate Author : COUNCIL FOR SCIENTIFIC AND INDUSTRIAL RESEARCH PRETORIA (SOUTH AFRICA)

Personal Author(s) : Baker,Dirk E. ; Neut,Cornelis A. Van Der

Report Date : FEB 1987

Pagination or Media Count : 15

Abstract : For certain applications the antenna designer may require a knowledge of the small scale, or localed, reflectivity properties of microwave absorbers. Suppliers of microwave absorbers generally quote the average absorption achieved over fairly large panels (610 mmx 610 mm) as determined by one of several free-space measurement techniques. By the nature of their construction, small samples of planar absorber panels cannot generally be evaluated directly in waveguide, particularly at X-band and above.

Descriptors :   *ABSORBERS(MATERIALS), *RADIATION ABSORPTION, *PLANAR STRUCTURES, *REFLECTIVITY, *PANELS, HOMOGENEITY, FREQUENCY RESPONSE, X BAND, SOUTH AFRICA

Subject Categories : Radiofrequency Wave Propagation

Distribution Statement : APPROVED FOR PUBLIC RELEASE