Accession Number : ADP006669

Title :   Characterization of PZT Films Fatigue at Low Frequency,

Corporate Author : AEROSPACE CORP EL SEGUNDO CA

Personal Author(s) : Lipeles, R. A. ; Morgan, B. A. ; Leung, M. S.

Report Date : 05 APR 1991

Pagination or Media Count : 8

Abstract : We report a method using SEM, EDX, SIMS, and polarization-voltage hysteresis data to investigate changes that occur in PZT thin films fatigued using low (below 100 kHz) frequency square waves. Fatigue in PZT capacitors can limit the lifetime of destructive readout ferroelectric memories. Identification of physical and electronic changes that occur during fatigue will lead to understanding fatigue mechanisms and the development of improved. Electrode-Ferroelectric interfaces.

Descriptors :   *THIN FILM CAPACITORS, *FERROELECTRIC MATERIALS, ELECTRONICS, FREQUENCY, HYSTERESIS, IDENTIFICATION, POLARIZATION, SQUARE WAVES, THIN FILMS, VOLTAGE, LEAD TITANATES, ZIRCONATES, FATIGUE(MECHANICS), MEMORY DEVICES.

Subject Categories : Electricity and Magnetism
      Electrical and Electronic Equipment

Distribution Statement : APPROVED FOR PUBLIC RELEASE