Accession Number : ADP007056

Title :   Model Study of Refractive Effects on X-Ray Laser Coherence,

Corporate Author : LAWRENCE LIVERMORE NATIONAL LAB CA

Personal Author(s) : Amendt, Peter ; London, Richard A. ; Strauss, Moshe

Report Date : 22 MAY 1992

Pagination or Media Count : 5

Abstract : The role of smoothly varying transverse gain and refraction profiles on x-ray laser intensity and coherence is analyzed by modally expanding the electric field within the paraxial approximation. Comparison with a square transverse profile reveals that smooth-edged profiles lead to: (1) a greatly reduced number of guided modes, (2) the continued cancellation of local intensity from a loosely guided mode by resonant free modes, (3) and the absence of extraneous (or anomalous) free mode resonances. These generic spectral properties should enable a considerable simplification in analyzing and optimizing the coherence properties of laboratory soft x-ray lasers.

Descriptors :   *X RAY LASERS, *COHERENT OPTICAL RADIATION, LASER APPLICATIONS, SOFT X RAYS, SHORT WAVELENGTHS, GAIN, HOLOGRAPHY, COHERENT RADIATION, RESONANT FREQUENCY, REFRACTION, SYMPOSIA.

Subject Categories : Optics
      Lasers and Masers
      Nuclear Physics & Elementary Particle Physics

Distribution Statement : APPROVED FOR PUBLIC RELEASE