Accession Number : ADP007644
Title : New Scheme of Electro-Optic Sampling by Probe-Beam Polarization Modulation,
Corporate Author : TOKYO UNIV (JAPAN)
Personal Author(s) : Takahashi, Ryo ; Kamiya, Takeshi
Report Date : 22 MAY 1992
Pagination or Media Count : 4
Abstract : A new scheme of noise suppression in electrooptic sampling system by the probe beam polarization modulation is proposed, its operation principle is analyzed and the performance is demonstrated experimentally. The method has the advantages that narrow- band detection can be used Instead of modulating the device under test with doubled sensitivity compared with the conventional methods.
Descriptors : *ELECTROOPTICS, *LIGHT MODULATORS, *OPTICAL DETECTION, *NOISE REDUCTION, *NOISE(ELECTRICAL AND ELECTROMAGNETIC), DETECTION, MODULATION, POLARIZATION, PROBES, SAMPLING, SENSITIVITY, SUPPRESSION, TEST AND EVALUATION, LASERS, SYMPOSIA, INTEGRATED CIRCUITS, GALLIUM ARSENIDES.
Subject Categories : Electrooptical and Optoelectronic Devices
Electricity and Magnetism
Distribution Statement : APPROVED FOR PUBLIC RELEASE