Accession Number : ADP007660

Title :   All-Optical Microwave Gain Measurements on MMIC Amplifiers,

Corporate Author : LIGHTWAVE ELECTRONICS CORP MOUNTAIN VIEW CA

Personal Author(s) : Weingarten, Kurt J. ; Riaziat, Majid

Report Date : 22 MAY 1992

Pagination or Media Count : 5

Abstract : All-optical swept-frequency measurement of the gain of two types of microwave integrated circuits, a feedback amplifier and a distributed amplifier, is demonstrated. A diode laser excites an on-chip photodetector and the circuit response is measured with electro-optic sampling. The only physical contact probes are DC bias probes for the circuit and the on-chip MSM photodetector. ne optically measured gains compare favorably to independent network analyzer measurements using contact probing. The integrated photodetector needed for signal generation is process compatible with MMIC technology, occupies a small space on the wafer, and requires no additional processing steps. Since the yield of the photodetector is very high compared to the MMICs, the all optical test is potentially a practical and low cost approach for RF monitoring of circuits.

Descriptors :   *PHOTODETECTORS, *OPTICAL CIRCUITS, *ELECTROOPTICS, AMPLIFIERS, CIRCUITS, COSTS, DIODES, DISTRIBUTED AMPLIFIERS, FEEDBACK, FEEDBACK AMPLIFIERS, FREQUENCY, GAIN, INTEGRATED CIRCUITS, LASERS, LOW COSTS, MEASUREMENT, MICROWAVES, MONITORING, NETWORKS, OPTICS, PROBES, PROCESSING, RESPONSE, SAMPLING, SIGNAL GENERATION, SIGNALS, TEST AND EVALUATION, WAFERS, OPTICAL DETECTION, SYMPOSIA.

Subject Categories : Electrooptical and Optoelectronic Devices
      Optical Detection and Detectors

Distribution Statement : APPROVED FOR PUBLIC RELEASE