Accession Number : ADP008038
Title : Roughness Evolution in Films and Multilayer Structures,
Corporate Author : WISCONSIN UNIV-MADISON
Personal Author(s) : Lagally, M.G.
Report Date : 05 MAR 1992
Pagination or Media Count : 4
Abstract : Structures fabricated from multiple layers of very thin films make up an increasing component of our high-technology base in electronics, photonics, and x-ray optics. In particular, in x-ray optics, quite dissimilar materials are combined to create what are effectively one-dimensional diffraction gratings, in which the layers must have indices of refraction that are as different as possible. But that feature alone is not enough. The interfaces between the different layers affect the quality of the structure as an x-ray reflector, bringing into consideration questions of crystal growth and the kinetic and thermodynamic mechanisms of growth. This paper provides an overview of the most important kinetic mechanisms that control growth and illustrates then with scanning tunneling microscopy (STM) and diffraction measurements.
Descriptors : *OPTICS, *THIN FILMS, *X RAY APPARATUS, CRYSTAL GROWTH, ELECTRONICS, GRATINGS(SPECTRA), INTERFACES, KINETICS, LAYERS, ONE DIMENSIONAL, PHOTONICS, REFLECTORS, REFRACTION, SCANNING, STRUCTURES, THERMODYNAMICS, TUNNELING(ELECTRONICS), X RAYS, X RAY DIFFRACTION.
Subject Categories : Optics
Nuclear Physics & Elementary Particle Physics
Distribution Statement : APPROVED FOR PUBLIC RELEASE