Accession Number : ADP008039

Title :   X-Ray Scattering Studies of Correlated Interface Roughness in Multilayers,

Corporate Author : EXXON RESEARCH AND ENGINEERING CO ANNANDALE NJ

Personal Author(s) : Sinha, S.K. ; Sanyal, M.K. ; Satija, S.K. ; Majkrzak, C.F. ; Schuller, I.K.

Report Date : 05 MAR 1992

Pagination or Media Count : 4

Descriptors :   *X RAY SCATTERING, *OPTICAL PROPERTIES, INTERFACES, ROUGHNESS, X RAY APPARATUS.

Subject Categories : Optics
      Nuclear Physics & Elementary Particle Physics

Distribution Statement : APPROVED FOR PUBLIC RELEASE