Accession Number : ADP008043

Title :   Surface Roughness and X-Ray Scattering,

Corporate Author : ARMY ARMAMENT RESEARCH DEVELOPMENT AND ENGINEERING CENTER PICATINNY ARSENAL N J

Personal Author(s) : Church, E.L. ; Takacs, P.Z.

Report Date : 05 MAR 1992

Pagination or Media Count : 4

Abstract : Interface roughness and diffusion limit the performance of x-ray multilayer (ML) stacks by generating unwanted scattering and reducing their efficiencies. A number of routines for evaluating these effects are described in the literature. Their development involves two steps: the modelling of the properties of a single interface, and the combination of the effects of many interfaces to determine the performance of the stack. Our discussion here is concerned principally with the first step, the critical single-interface part of the problem.

Descriptors :   *SURFACE ROUGHNESS, *X RAY SCATTERING, DIFFUSION, EFFICIENCY, INTERFACES, NUMBERS, ROUGHNESS, SCATTERING, X RAYS, SURFACES, LAYERS, MODELS, REFLECTION, POWER SPECTRA, DENSITY, ONE DIMENSIONAL, TWO DIMENSIONAL, MECHANICS.

Subject Categories : Mechanics
      Physical Chemistry
      Nuclear Physics & Elementary Particle Physics

Distribution Statement : APPROVED FOR PUBLIC RELEASE