Accession Number : ADP008053

Title :   Multilayer X-Ray Mirror Absolute Reflectivity, Energy Band Pass and Overlapping Order Determination Using an X-Ray Tube and a SI(LI) Detector,

Corporate Author : PARIS-11 UNIV ORSAY (FRANCE) LAB POUR L'UTILISATION DU RAYONNEMENT ELECTROMAG NETIQUE

Personal Author(s) : Dhez, P. ; Duval, H. ; Malaurent, J.C.

Report Date : 05 MAR 1992

Pagination or Media Count : 4

Abstract : X-ray interference mirrors are a particular case of artificial multilayered media for which the wanted property is a high intensity of the diffraction phenomena itself. For such applications ons needs to know the performance of the mirrors at different wavelengths. We would like to demonstrate here how such X-ray reflectivity tests can be achieved on a laboratory apparatus to got absolute reflectivity and without the need of a synchrotron source.

Descriptors :   *DIFFRACTION, *MIRRORS, *REFLECTIVITY, *X RAYS, *SILICON, HIGH INTENSITY, INTENSITY, INTERFERENCE, LABORATORIES, MEDIA, SYNCHROTRONS, TEST AND EVALUATION, LAYERS, DETECTORS, SPECULAR REFLECTION, ENERGY BANDS, BRAGG ANGLE, X RAY TUBES, PHOTONS, ANGLE OF INCIDENCE.

Subject Categories : Optics
      Nuclear Physics & Elementary Particle Physics
      Radiofrequency Wave Propagation
      Inorganic Chemistry

Distribution Statement : APPROVED FOR PUBLIC RELEASE