Accession Number : ADP008053
Title : Multilayer X-Ray Mirror Absolute Reflectivity, Energy Band Pass and Overlapping Order Determination Using an X-Ray Tube and a SI(LI) Detector,
Corporate Author : PARIS-11 UNIV ORSAY (FRANCE) LAB POUR L'UTILISATION DU RAYONNEMENT ELECTROMAG NETIQUE
Personal Author(s) : Dhez, P. ; Duval, H. ; Malaurent, J.C.
Report Date : 05 MAR 1992
Pagination or Media Count : 4
Abstract : X-ray interference mirrors are a particular case of artificial multilayered media for which the wanted property is a high intensity of the diffraction phenomena itself. For such applications ons needs to know the performance of the mirrors at different wavelengths. We would like to demonstrate here how such X-ray reflectivity tests can be achieved on a laboratory apparatus to got absolute reflectivity and without the need of a synchrotron source.
Descriptors : *DIFFRACTION, *MIRRORS, *REFLECTIVITY, *X RAYS, *SILICON, HIGH INTENSITY, INTENSITY, INTERFERENCE, LABORATORIES, MEDIA, SYNCHROTRONS, TEST AND EVALUATION, LAYERS, DETECTORS, SPECULAR REFLECTION, ENERGY BANDS, BRAGG ANGLE, X RAY TUBES, PHOTONS, ANGLE OF INCIDENCE.
Subject Categories : Optics
Nuclear Physics & Elementary Particle Physics
Radiofrequency Wave Propagation
Distribution Statement : APPROVED FOR PUBLIC RELEASE