Accession Number : ADP008054

Title :   A Soft X-Ray and Extreme U.V. Reflectometer Using a Laser Produced Plasma Source and a High Throughput Monochromator,

Corporate Author : CALIFORNIA UNIV BERKELEY LAWRENCE BERKELEY LAB

Personal Author(s) : Gullikson, E.M. ; Underwood, J.H. ; Batson, P.C. ; Nikitin, V.

Report Date : 05 MAR 1992

Pagination or Media Count : 2

Abstract : Measurement in the soft x-ray and extreme ultraviolet regions of the spectrum have historically been hampered by the lack of bright, tunable source. Although synchrotron radiation sources are gradually filling this need, such facilities are not sufficiently compact and inexpensive to be within the reach of an average laboratory. The commercial availability of compact, inexpensive pulsed lasers has changed this picture. The high temperature plasma produced when the light from such a laser is focused upon a suitable metal or dielectric target emits x-rays and extreme ultraviolet radiation that can either be a rich line spectrum or a smooth and intense continuum, depending upon the target material. Such a source needs only monochromatization to make it useful for a wide variety of measurements and calibrations.

Descriptors :   *SOFT X RAYS, *REFLECTOMETERS, *LASERS, *PLASMAS(PHYSICS), *MONOCHROMATORS, ULTRAVIOLET EQUIPMENT, SOURCES, THROUGHPUT, OPTICS, MEASUREMENT, SPECTRA, TUNABLE LASERS, SYNCHROTRON RADIATION, PULSED LASERS, HIGH TEMPERATURE, METALS, DIELECTRICS.

Subject Categories : Nuclear Physics & Elementary Particle Physics
      Lasers and Masers
      Optics
      Electricity and Magnetism

Distribution Statement : APPROVED FOR PUBLIC RELEASE