Accession Number : ADP008177

Title :   Characterization of Photorefractive Effect in Annealed Proton-Exchanged (APE) LiNbO3 Waveguides in the Visible Region,

Corporate Author : FLORIDA UNIV GAINESVILLE DEPT OF ELECTRICAL ENGINEERING

Personal Author(s) : Cao, Xianofan ; Fujiwara, Takumi ; Ramaswamy, Ramu V. ; Srivastava, Ramakant

Report Date : APR 1992

Pagination or Media Count : 2

Abstract : Annealed proton exchanged(APE) LiNbO3 waveguides with recovered electro-optic/nonlinear coefficients and low propagation loss are widely used in integrated optics. Although it is known that the PE LiNbO3 waveguides have higher resistance to photorefractive damage than Ti-diffused LiNbO3 waveguides), a feature which is quite attractive for nonlinear guided wave applications such as efficient diode laser doubling), a quantitative characterization of photorefractive effect in APE LiNbO3 waveguides in the visible region has not yet been reported.

Descriptors :   *OPTICAL WAVEGUIDES, *ELECTROOPTICS, COEFFICIENTS, DAMAGE, DIODES, LASERS, OPTICS, PROPAGATION, PROTONS, REGIONS, RESISTANCE, LITHIUM NIOBATES, TRANSMISSION LOSS, LOW LOSS.

Subject Categories : Electrooptical and Optoelectronic Devices

Distribution Statement : APPROVED FOR PUBLIC RELEASE