Accession Number : ADP008641
Title : Digital Approach for Pattern Scale Measurement,
Corporate Author : TECHNION - ISRAEL INST OF TECH HAIFA DEPT OF ELECTRICAL ENGINEERING
Personal Author(s) : Rosen, Joseph ; Dezialoshinski, Lior ; Nahtomi, Ehud ; Shamir, Joseph
Report Date : 22 MAY 1992
Pagination or Media Count : 4
Abstract : Pattern size measurement is important for applications such as industrial classification and ranging. Optical systems offer fast and parallel processing of detailed pictures. A recently proposed method based on an optical correlator, measures pattern size using a specially designed spatial filter. This method is not shift invariant and is quite sensitive to noise owing to its analog operation. In this work we extend the system to k parallel correlation channels, as shown. The field of view of a TV camera is displayed on an SLM, and processed by k parallel correlators. The correlation peaks collected from the k channels at one arbitrary point, indicate the detection of a known objects. The binary word of k bits, which is created by these peaks, determine the scale of every object in the field of view simultaneously.
Descriptors : *OPTICAL PROCESSING, *PATTERNS, *PARALLEL PROCESSING, DIGITAL SYSTEMS, SYSTEMS APPROACH, CORRELATION, SCALE, MEASUREMENT.
Subject Categories : Optics
Distribution Statement : APPROVED FOR PUBLIC RELEASE